Spectrum Logic detectors for Synchrotrons will be on display at the 38th Annual Meeting of the Synchrotron Radiation Society of Japan and Joint Symposium on Synchrotron Radiation Science held on 10-12 January 2025 at Tsukuba International Conference Center, Tsukuba City, Ibaraki Prefecture.
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Spectrum Logic exhibited at JIMA 2024 in Tokyo, Japan (18-20 September)
Spectrum Logic will be exhibiting at the 12th Japan Inspection Instruments Manufacturers' Show (JIMA) at Tokyo Big Sight 18th-20th September. This exhibition is organised by the Japan Inspection Instruments Manufacturers' Association, is the leading exhibition for industrial NDT and AXI in Japan. It features key players in the X-ray inspection industry showcasing the latest advances in X-ray technology and other inspection methods.
Read MoreCelebrating Rosalind Franklin's Contribution to the Discovery of DNA's Structure
Celebrating Rosalind Franklin's Contribution to the Discovery of DNA's Structure
Rosalind Franklin was a pioneering British biophysicist and X-ray crystallographer born on July 25, 1920, in London. She played a crucial role in understanding the molecular structures of DNA, RNA, viruses, coal, and graphite. Excelling in science from a young age, she earned her Ph.D. from the University of Cambridge. Franklin is best known for her pivotal contributions to the discovery of DNA's double helix structure during her tenure at King's College London in the early 1950s. Her meticulous X-ray diffraction work led to the capture of Photograph 51, an image that provided critical evidence of DNA's helical structure.
Read MoreWater-Cooled 2824HR and 2824HS CMOS X-ray Detectors for Low Noise Dynamic Imaging
Spectrum Logic has now released water-cooled versions of the 2824HR and 2824HS detectors to further improve their market leading performance. In the cooled detectors water circulates between a chiller unit and a heat exchanger in the detector housing. This cools the detector and maintains a stable temperature which is configured at the chiller. The stable temperature reduces dark noise and stability of the temperature of the sensor array means that the offset correction is stable and does not suffer from variations in the dark image due to temperature changes in the CMOS sensors in the detector.
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